Stability of zinc nitride thin-film transistors under...

Solid-State Electronics 2020 / 09 Vol. 171

Stability of zinc nitride thin-film transistors under positive and negative bias stress

Dominguez, Miguel A., Pau, Jose Luis, Redondo-Cubero, Andrés
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
171
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2020.107841
Date:
September, 2020
File:
PDF, 1.48 MB
2020
Conversion to is in progress
Conversion to is failed