Surface EXAFS Study of the Si/AsGa(110) Interface: First...

Japanese Journal of Applied Physics 1993 / 01 Vol. 32; Iss. S2

Surface EXAFS Study of the Si/AsGa(110) Interface: First Results

Hasnoui, M. L., Lagarde, P., Delaunay, R., Rossi, G., Flank, A.-M.
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Volume:
32
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAPS.32S2.391
Date:
January, 1993
File:
PDF, 344 KB
1993
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