Arsenic Exposure and Methylation Efficiency in Relation to...

Arsenic Exposure and Methylation Efficiency in Relation to Oxidative Stress in Semiconductor Workers

Pan, Chih-Hong, Lin, Ching-Yu, Lai, Ching-Huang, Jeng, Hueiwang Anna
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Volume:
11
Journal:
Atmosphere
DOI:
10.3390/atmos11050464
Date:
May, 2020
File:
PDF, 433 KB
2020
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