[IEEE 2020 IEEE Latin American Test Symposium (LATS) - Maceio, Brazil (2020.3.30-2020.4.2)] 2020 IEEE Latin-American Test Symposium (LATS) - Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects
Copetti, Thiago, Medeiros, Guilherme Cardoso, Taouil, Mottaqiallah, Hamdioui, Said, Poehls, Leticia Bolzani, Balen, TiagoYear:
2020
DOI:
10.1109/LATS49555.2020.9093667
File:
PDF, 421 KB
2020