![](/img/cover-not-exists.png)
Mapping of individual dislocations with dark-field X-ray microscopy
Jakobsen, A. C., Simons, H., Ludwig, W., Yildirim, C., Leemreize, H., Porz, L., Detlefs, C., Poulsen, H. F.Volume:
52
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576718017302
Date:
February, 2019
File:
PDF, 1.36 MB
2019