Mapping of individual dislocations with dark-field X-ray...

Journal of Applied Crystallography 2019 / 02 Vol. 52; Iss. 1

Mapping of individual dislocations with dark-field X-ray microscopy

Jakobsen, A. C., Simons, H., Ludwig, W., Yildirim, C., Leemreize, H., Porz, L., Detlefs, C., Poulsen, H. F.
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Volume:
52
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576718017302
Date:
February, 2019
File:
PDF, 1.36 MB
2019
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