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[IEEE 2020 IEEE Latin American Test Symposium (LATS) - Maceio, Brazil (2020.3.30-2020.4.2)] 2020 IEEE Latin-American Test Symposium (LATS) - Wafer-Level Die Re-Test Success Prediction Using Machine Learning
Selg, Hardi, Jenihhin, Maksim, Ellervee, PeeterYear:
2020
DOI:
10.1109/LATS49555.2020.9093672
File:
PDF, 243 KB
2020