Remaining Useful Life Prediction Based on an Adaptive Inverse Gaussian Degradation Process With Measurement Errors
Chen, Xudan, Sun, Xinli, Si, Xiaosheng, Li, GuodongVolume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/access.2019.2961951
File:
PDF, 6.47 MB
2020