Performance of SiC cascode JFETs under single and...

Microelectronics Reliability 2020 / 07 Vol. 110

Performance of SiC cascode JFETs under single and repetitive avalanche pulses

Agbo, S.N., Ortiz-Gonzalez, J., Alatise, O.
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Volume:
110
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113644
Date:
July, 2020
File:
PDF, 5.93 MB
2020
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