Calibration on the Fly--A Novel Two-Port S-Parameter...

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IEEE Transactions on Microwave Theory and Techniques 2020

Calibration on the Fly--A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky Systems

Wu, Aihua, Liu, Chen, Liang, Faguo, Zou, Xuefeng, Wang, Yibang, Luan, Peng, Li, Chong, Ridler, Nick
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Year:
2020
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2020.2988461
File:
PDF, 2.86 MB
2020
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