Dependence of Channel Hot-Electron Injection on MOSFET...

Japanese Journal of Applied Physics 1982 / 01 Vol. 21; Iss. S1

Dependence of Channel Hot-Electron Injection on MOSFET Structure

Kume, Hitoshi, Takeda, Eiji, Toyabe, Toru, Asai, Shojiro
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Volume:
21
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAPS.21S1.67
Date:
January, 1982
File:
PDF, 689 KB
1982
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