![](/img/cover-not-exists.png)
Investigation of V2O5/Ge8Sb92 multilayer thin film for high-data-retention and high-speed phase change memory applications
Xu, Yongkang, Hu, Yifeng, Sun, Song, Zhu, Xiaoqin, Lai, TianshuVolume:
126
Journal:
Applied Physics A
DOI:
10.1007/s00339-020-03706-z
Date:
July, 2020
File:
PDF, 1.60 MB
2020