Nanoscale profiling of multilayer graphene films on silicon carbide by a focused ion beam
Kolomiytsev, A.S., Jityaev, I.L., Svetlichnyi, A.M., Fedotov, A.A., Ageev, O.A.Volume:
108
Journal:
Diamond and Related Materials
DOI:
10.1016/j.diamond.2020.107969
Date:
October, 2020
File:
PDF, 2.63 MB
2020