Functional test environment for time-triggered control...

Microprocessors and Microsystems 2020 / 07 Vol. 76

Functional test environment for time-triggered control systems in complex MPSoCs

Seyyedi, Razi, Schreiner, Sören, Fakih, Maher, Grüttner, Kim, Nebel, Wolfgang
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Volume:
76
Journal:
Microprocessors and Microsystems
DOI:
10.1016/j.micpro.2020.103072
Date:
July, 2020
File:
PDF, 2.77 MB
2020
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