A Study of Transient Voltage Peaking in Diode-Based ESD...

IEEE Access 2020 Vol. 8

A Study of Transient Voltage Peaking in Diode-Based ESD Protection Structures in 28nm CMOS

Wang, Chenkun, Zhang, Feilong, Lu, Fei, Chen, Qi, Li, Cheng, Wang, Albert
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2020.2992496
File:
PDF, 5.71 MB
2020
Conversion to is in progress
Conversion to is failed