![](/img/cover-not-exists.png)
Uncertainty Analysis of Stray Field Measurements by Quantitative Magnetic Force Microscopy
Hu, Xiukun, Dai, Gaoliang, Sievers, Sibylle, Scarioni, Alexander Fernandez, Neu, Volker, Bieler, Mark, Schumacher, Hans WernerYear:
2020
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2020.2986865
File:
PDF, 766 KB
2020