Criticality of depth of intensity modulation and simulation...

The European Physical Journal Applied Physics 2020 / 4 Vol. 90; Iss. 1

Criticality of depth of intensity modulation and simulation of refractive index profile in thermal lens technique

Raj, Vimal, Swapna, Mohanachandran Nair Sindhu, Sankararaman, Sankaranarayana Iyer
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Volume:
90
Journal:
The European Physical Journal Applied Physics
DOI:
10.1051/epjap/2020200024
Date:
April, 2020
File:
PDF, 2.28 MB
2020
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