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[IEEE 2020 IEEE International Memory Workshop (IMW) - Dresden, Germany (2020.5.17-2020.5.20)] 2020 IEEE International Memory Workshop (IMW) - Extremely Biased Error Correction Method to Reduce Read Disturb Errors of 3D-TLC NAND Flash Memories by 60%
Aihara, Hiroki, Maeda, Kyosuke, Suzuki, Shun, Takeuchi, KenYear:
2020
DOI:
10.1109/IMW48823.2020.9108117
File:
PDF, 359 KB
2020