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[IEEE 2019 24th Microoptics Conference (MOC) - Toyama, Japan (2019.11.17-2019.11.20)] 2019 24th Microoptics Conference (MOC) - Feasibility Study of Scanning Photocurrent Microscopy in Ultra-Thin Silicon Nanowire Ohmic-Contact Devices
Chu, Cheng-Hao, Mao, Ming-HuaYear:
2019
DOI:
10.23919/MOC46630.2019.8982753
File:
PDF, 916 KB
2019