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Materials Characterization 2020 / 6

Statistical analysis of EBSD data to predict potential abnormal grain growth in 3.0 wt% Si grain-oriented electrical steel

Lee, Seil, Ko, Kyung Jun, Kim, Se-Jong, Park, Jong Tae
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Journal:
Materials Characterization
DOI:
10.1016/j.matchar.2020.110450
Date:
June, 2020
File:
PDF, 1.29 MB
2020
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