Quantitative phase‐mode electrostatic force microscopy on...

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Quantitative phase‐mode electrostatic force microscopy on silicon oxide nanostructures

ALBONETTI, CRISTIANO, CHIODINI, STEFANO, ANNIBALE, PAOLO, STOLIAR, PABLO, MARTINEZ, RAMSES V., GARCIA, RICARDO, BISCARINI, FABIO
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Journal:
Journal of Microscopy
DOI:
10.1111/jmi.12938
Date:
June, 2020
File:
PDF, 2.96 MB
2020
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