Quantitative phaseâmode electrostatic force microscopy on silicon oxide nanostructures
ALBONETTI, CRISTIANO, CHIODINI, STEFANO, ANNIBALE, PAOLO, STOLIAR, PABLO, MARTINEZ, RAMSES V., GARCIA, RICARDO, BISCARINI, FABIOJournal:
Journal of Microscopy
DOI:
10.1111/jmi.12938
Date:
June, 2020
File:
PDF, 2.96 MB
2020