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[IEEE 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Grenoble, France (2020.3.9-2020.3.13)] 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - High-Density, Low-Power Voltage-Control Spin Orbit Torque Memory with Synchronous Two-Step Write and Symmetric Read Techniques
Wang, Haotian, Kang, Wang, Zhang, Liuyang, Zhang, He, Kaushik, Brajesh Kumar, Zhao, WeishengYear:
2020
DOI:
10.23919/DATE48585.2020.9116576
File:
PDF, 2.02 MB
2020