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[IEEE 2019 49th European Microwave Conference (EuMC) - Paris, France (2019.10.1-2019.10.3)] 2019 49th European Microwave Conference (EuMC) - All-Oxide Thin Film Varactor: From Test Structure to SMD Component
Walk, D., Kienemund, D., Salg, P., Zeinar, L., Radetinac, A., Komissinskiy, P., Alff, L., Jakoby, R., Maune, H.Year:
2019
DOI:
10.23919/EuMC.2019.8910758
File:
PDF, 482 KB
2019