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[IEEE 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - Penang, Malaysia (2020.4.6-2020.4.21)] 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - Reliability Analysis Of Gate-All-Around Floating Gate (GAA-FG) With Variable Oxide Thickness For Flash Memory Cell
Hamid, Farah, Alias, N. Ezaila, Hamzah, Afiq, Johari, Zaharah, Tan, M. L. Peng, Ismail, Razali, Soin, NorhayatiYear:
2020
DOI:
10.1109/EDTM47692.2020.9117949
File:
PDF, 574 KB
2020