[IEEE 2020 94th ARFTG Microwave Measurement Symposium (ARFTG) - San Antonio, TX, USA (2020.1.26-2020.1.29)] 2020 94th ARFTG Microwave Measurement Symposium (ARFTG) - Characterization of Thermal and Trapping Time Constants in a GaN HEMT
Kellogg, Kevin, Khandelwal, Sourabh, Dunleavy, Larry, Wang, JingYear:
2020
DOI:
10.1109/ARFTG47584.2020.9071731
File:
PDF, 181 KB
2020