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[IEEE 2020 IEEE International Memory Workshop (IMW) - Dresden, Germany (2020.5.17-2020.5.20)] 2020 IEEE International Memory Workshop (IMW) - Performance and Reliability of 4 Mb eFLASH Memory Array Featuring 28 nm Split-Gate Cell with HKMG Select Transistor
Jourba, S., Bollon, N., Decobert, C., Festes, G., Bertello, B., Zhou, F., Markov, V., Tkachev, Y., Kim, J., Ghazav, P., Liu, X., Do, N., Richter, R., Dunkel, S., Trentzsch, M., Zaka, A., Herrmann, T.,Year:
2020
DOI:
10.1109/IMW48823.2020.9108118
File:
PDF, 796 KB
2020