[IEEE 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Grenoble, France (2020.3.9-2020.3.13)] 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Robust and High-Performance 12-T Interlocked SRAM for In-Memory Computing
Surana, Neelam, Lavania, Mili, Barma, Abhishek, Mekie, JoyceeYear:
2020
DOI:
10.23919/DATE48585.2020.9116361
File:
PDF, 1.85 MB
2020