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[IEEE 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Grenoble, France (2020.3.9-2020.3.13)] 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - In-Memory Resistive RAM Implementation of Binarized Neural Networks for Medical Applications
Penkovsky, Bogdan, Bocquet, Marc, Hirtzlin, Tifenn, Klein, Jacques-Olivier, Nowak, Etienne, Vianello, Elisa, Portal, Jean-Michel, Querlioz, DamienYear:
2020
DOI:
10.23919/DATE48585.2020.9116439
File:
PDF, 1.08 MB
2020