ions in an electron-beam ion trap
Scheers, J., Shah, C., Ryabtsev, A., Bekker, H., Torretti, F., Sheil, J., Czapski, D. A., Berengut, J. C., Ubachs, W., López-Urrutia, J. R. Crespo, Hoekstra, R., Versolato, O. O.Volume:
101
Journal:
Physical Review A
DOI:
10.1103/PhysRevA.101.062511
Date:
June, 2020
File:
PDF, 3.79 MB
2020