[IEEE 2020 4th IEEE Electron Devices Technology &...

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[IEEE 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - Penang, Malaysia (2020.4.6-2020.4.21)] 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - General Formula to Capture the Impact of Dummy Gates on Layout Dependent Effects Modeling of Multi-finger MOSFETs

Xia, Kejun, Zhang, Qilin, Sheng, Hanyu, Chao, Lei, Li, Wuxia
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Year:
2020
DOI:
10.1109/edtm47692.2020.9117843
File:
PDF, 383 KB
2020
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