Deep learning for fault-relevant feature extraction and...

Journal of Process Control 2020 / 08 Vol. 92

Deep learning for fault-relevant feature extraction and fault classification with stacked supervised auto-encoder

Wang, Yalin, Yang, Haibing, Yuan, Xiaofeng, Schardt, Yuri A.W., Yang, Chunhua, Gui, Weihua
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Volume:
92
Journal:
Journal of Process Control
DOI:
10.1016/j.jprocont.2020.05.015
Date:
August, 2020
File:
PDF, 2.84 MB
2020
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