[IEEE 2020 43rd International Spring Seminar on Electronics Technology (ISSE) - Demanovska Valley, Slovakia (2020.5.14-2020.5.15)] 2020 43rd International Spring Seminar on Electronics Technology (ISSE) - Study of Process Variability-Sensitive Local Device Parameters for 14-nm Bulk FinFETs

The file will be sent to your email address. It may take up to 1-5 minutes before you receive it.

The file will be sent to you via the Telegram messenger. It may take up to 1-5 minutes before you receive it.

Note: Make sure you have linked your account to Z-Library Telegram bot.

The file will be sent to your Kindle account. It may take up to 1–5 minutes before you receive it.

Please note: you need to verify every book you want to send to your Kindle. Check your mailbox for the verification email from Amazon Kindle.