An electrical resistance degradation model for thin film...

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Fatigue & Fracture of Engineering Materials & Structures 2020 / 06

An electrical resistance degradation model for thin film under fatigue loading

Cheng, Jiaxing, Li, Zhaoxia
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Journal:
Fatigue & Fracture of Engineering Materials & Structures
DOI:
10.1111/ffe.13278
Date:
June, 2020
File:
PDF, 3.25 MB
2020
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