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[IEEE 2020 43rd International Spring Seminar on Electronics Technology (ISSE) - Demanovska Valley, Slovakia (2020.5.14-2020.5.15)] 2020 43rd International Spring Seminar on Electronics Technology (ISSE) - Reliability of Mechatronic Integrated Devices Regarding Failure Mechanisms
Braeuer, Philipp, Wurzer, Lukas, Kuhn, Thomas, Knoeller, Andrea, Mueller, Hagen, Eberhardt, Wolfgang, Zimmermann, Andre, Franke, JoergYear:
2020
DOI:
10.1109/ISSE49702.2020.9120883
File:
PDF, 197 KB
2020