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[IEEE 2020 43rd International Spring Seminar on Electronics Technology (ISSE) - Demanovska Valley, Slovakia (2020.5.14-2020.5.15)] 2020 43rd International Spring Seminar on Electronics Technology (ISSE) - Analysis of Parameter Variability Depending on FinFET Wafer Location
Angelov, George, Nikolov, Dimitar, Spasova, Mariya, Radonov, Rossen, Gieva, ElitsaYear:
2020
DOI:
10.1109/ISSE49702.2020.9121089
File:
PDF, 1.13 MB
2020