In-SituScanning Electron Microscopy/Electron Backscattered...

Metallurgical and Materials Transactions A 2011 / 03 Vol. 42; Iss. 3

In-SituScanning Electron Microscopy/Electron Backscattered Diffraction Observation of Microstructural Evolution duringα

Tatsuya Fukino, Sadahiro Tsurekawa, Yasuhiro Morizono
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Volume:
42
Language:
english
Pages:
7
DOI:
10.1007/s11661-010-0285-4
Date:
March, 2011
File:
PDF, 674 KB
english, 2011
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