Modeling of Transfer Impedance in Automotive BCI Test System with Closed-Loop Method
LEE, Junesang, LEE, Hosang, HA, Jungrae, KIM, Minho, YUN, Sangwon, KIM, Yeongsik, NAH, WansooVolume:
E103.B
Journal:
IEICE Transactions on Communications
DOI:
10.1587/transcom.2019ebp3144
Date:
April, 2020
File:
PDF, 3.69 MB
2020