In-SituMicrotomographic Characterization of Single-Cavity...

In-SituMicrotomographic Characterization of Single-Cavity Growth During High-Temperature Creep of Leaded Brass

A. Isaac, K. Dzieciol, F. Sket, A. Borbély
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Volume:
42
Language:
english
Pages:
9
DOI:
10.1007/s11661-011-0781-1
Date:
October, 2011
File:
PDF, 690 KB
english, 2011
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