Nano-second timescale drain voltage induced electrical instabilities in hydrogenatedamorphous silicon thin film transistors
Sinha, Rajat, Bhattacharya, Prasenjit, Sambandan, Sanjiv, Shrivastava, MayankJournal:
Japanese Journal of Applied Physics
DOI:
10.35848/1347-4065/ab9ef5
Date:
June, 2020
File:
PDF, 708 KB
2020