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Resistive switching characteristics of UV assisted room temperature fabricated top-electrode-free SnOx ReRAM
Jung, Jungmo, Shin, Dongho, Lee, Yubin, Pak, JamesJournal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/ab92d1
Date:
May, 2020
File:
PDF, 555 KB
2020