[IEEE 2020 IEEE 9th Power India International Conference (PIICON) - SONEPAT, India (2020.2.28-2020.3.1)] 2020 IEEE 9th Power India International Conference (PIICON) - Investigation of Factors Affecting Nano-dielectric Strength under High Voltage Stress using Finite Element Method
Srivastava, Vinit, Rajpurohit, Bharat Singh, Kaur, ManbirYear:
2020
DOI:
10.1109/piicon49524.2020.9112929
File:
PDF, 2.00 MB
2020