X-Ray Photoelectron Spectroscopy Depth Profiling of...

X-Ray Photoelectron Spectroscopy Depth Profiling of Electrochemically Prepared Thin Oxide Layers on Duplex Stainless Steel

Črtomir Donik, Aleksandra Kocijan, Djordje Mandrino, Monika Jenko
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Volume:
42
Language:
english
Pages:
7
DOI:
10.1007/s11663-011-9532-3
Date:
October, 2011
File:
PDF, 1.83 MB
english, 2011
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