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An investigation into experimental in situ scanning electron microscope (SEM) imaging at high temperature
Heard, Rhiannon, Huber, John E., Siviour, Clive, Edwards, Gary, Williamson-Brown, Ed, Dragnevski, KalinVolume:
91
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5144981
Date:
June, 2020
File:
PDF, 17.88 MB
2020