TEM investigation of silicon carbide wafers with reduced...

TEM investigation of silicon carbide wafers with reduced micropipe density

S. E. Saddow, T. E. Schattner, M. Shamsuzzoha, S. V. Rendakova, V. A. Dmitriev
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
29
Year:
2000
Language:
english
Pages:
4
DOI:
10.1007/s11664-000-0078-4
File:
PDF, 183 KB
english, 2000
Conversion to is in progress
Conversion to is failed