Quantitative analysis of small amounts of cubic GaN phase...

Journal of Electronic Materials 2000 Vol. 29; Iss. 4

Quantitative analysis of small amounts of cubic GaN phase in GaN films grown on sapphire

D. Zhi, U. Tisch, S. H. Zamir, M. Wei, E. Zolotoyabko, J. Salzman
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Volume:
29
Year:
2000
Language:
english
Pages:
6
DOI:
10.1007/s11664-000-0161-x
File:
PDF, 204 KB
english, 2000
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