Electron beam induced current study of ion beam milling type conversion in molecular beam epitaxy vacancy-doped CdxHg1−xTe
R. Haakenaasen, T. Colin, H. Steen, L. Trosdahl-IversenVolume:
29
Year:
2000
Language:
english
Pages:
4
DOI:
10.1007/s11664-000-0236-8
File:
PDF, 426 KB
english, 2000