Electron microscopy of surface-crater defects on...

Journal of Electronic Materials 2003 Vol. 32; Iss. 7

Electron microscopy of surface-crater defects on HgCdTe/CdZnTe(211)B epilayers grown by molecular-beam epitaxy

T. Aoki, Y. Chang, G. Badano, J. Zhao, C. Grein, S. Sivananthan, David J. Smith
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Volume:
32
Year:
2003
Language:
english
Pages:
7
DOI:
10.1007/s11664-003-0056-8
File:
PDF, 3.19 MB
english, 2003
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