Positron-defect profiling in Cd1−xZnxTe wafers after saw...

Journal of Electronic Materials 2003 Vol. 32; Iss. 6

Positron-defect profiling in Cd1−xZnxTe wafers after saw cutting

Sean P. Mcneil, Kelvin G. Lynn, Marc H. Weber, Csaba Szeles, Raji Soundararajan
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Volume:
32
Year:
2003
Language:
english
Pages:
3
DOI:
10.1007/s11664-003-0145-8
File:
PDF, 2.52 MB
english, 2003
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