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Correlation between the electrical properties and the interfacial microstructures of TiAl-based ohmic contacts to p-type 4H-SiC
S. Tsukimoto, K. Nitta, T. Sakai, M. Moriyama, Masanori MurakamiVolume:
33
Year:
2004
Language:
english
Pages:
7
DOI:
10.1007/s11664-004-0203-x
File:
PDF, 1.22 MB
english, 2004