![](/img/cover-not-exists.png)
Investigation of HgCdTe surface quality following Br-based etching for device fabrication using spectroscopic ellipsometry
J. B. Varesi, J. D. Benson, M. Martinka, A. J. Stoltz, W. E. Mason, L. A. Almeida, A. W. Kaleczyc, P. R. Boyd, J. H. DinanVolume:
34
Year:
2005
Language:
english
Pages:
4
DOI:
10.1007/s11664-005-0016-6
File:
PDF, 116 KB
english, 2005