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Designing of a thin Mo diffusion barrier towards strong and reliable Ti/Cu dissimilar brazing
Deng, Yongqiang, Cong, Wei, Xu, HuibinVolume:
786
Journal:
Materials Science and Engineering: A
DOI:
10.1016/j.msea.2020.139469
Date:
June, 2020
File:
PDF, 1.32 MB
2020